Atomic force microscope LAFM-A10

https://www.labtron.co/ | info@labtron.co

Description :

Atomic force microscope LAFM-A10 comes with combined design of scan head and sample stage so as to give strong anti-vibration performance. Itâ€™s equipped with precision laser detection and probe alignment device for simple & easy adjustment of laser beam.

Specifications :

Operation modes	Contact mode, friction mode, extended modes of tapping phase, MFM, EFM, scans at random angle
Scan angle	Random angle
Maximum scan range	X/Y axis: 20 µm, Z axis: 2 µm
Optical system/ Magnification of CCD	Magnification: 4x, Resolution: 2.5 µm
Resolution	X/Y axis: 0.2 nm, Z axis: 0.05 nm
Sample size	Ø≤ 90 mm, H≤ 20 mm
Sample movement	0 to 20 mm
Pulse width of approaching motor	10 ± 2 ms
Scan rate	0.6 Hz to 4.34 Hz
Scanning control	XY: 18 bit D/A & double 16 bit A/D multiple channel simultaneously
Types of sampling pixel	256×256, 512×512
Feedback type	DSP digital feedback
Feedback sampling rate	64 KHz
PC connections:	USB 2.0
Windows software	Compatible with windows 98/2000/XP/7/8
Instrument Diemnsion	415 × 410 × 545 mm
Net weight	40 kg
Gross Weight	50 kg

Features :

Large range of sample transfer
Modular electronic system for easy maintenance
Adopted with spring for vibration isolation
Provides highly accurate results
Optical observation system for checking tip & sampleâ€™s position

Applications :

It finds best solution for applications in biochemistry for tissues, cells, cellular components imaging, nanotechnology for imaging of polymers, nanomaterials, and in chemistry physics for imaging of surface metals elements.

www.labtron.co

Labtron Equipment Ltd. Quatro House, Lyon Way, Camberley, Surrey GU16 7ER United Kingdom

Email: info@labtron.co | Website: https://www.labtron.co/ | Phone: +44 2080 043 608